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Materials Characterization (27)

Looking for the right Wiley title for your course? View Wiley Materials Science titles for Higher Education.
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Wiley Titles in Materials Characterization

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Advances in X-ray Tomography for Geomaterials
by Jacques Desrues (Editor), Gioacchino Viggiani (Editor), Pierre Bésuelle (Editor)
September 2006, Hardcover, Wiley-ISTE
US $225.00 Add to Cart
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Cannabinoids in Nature and Medicine
by Didier M. Lambert (Editor)
December 2008, Hardcover
US $175.00 Add to Cart
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Characterization and Analysis of Polymers
by Wiley
February 2008, Hardcover
US $295.00 Add to Cart
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Characterization of Materials, 2 Volume Set
by Elton N. Kaufmann (Editor)
February 2003, Hardcover
US $556.95 Add to Cart
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Digital Speckle Pattern Interferometry and Related Techniques
by Pramod K. Rastogi (Editor)
January 2001, Hardcover
US $480.00 Add to Cart
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Dynamic Loading and Characterization of Fiber-Reinforced Composites
by Robert L. Sierakowski, Shive K. Chaturvedi
March 1997, Hardcover
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Evaluating Materials Properties by Dynamic Testing (ESIS 20)
by E. van Walle
April 1996, Hardcover
US $300.00 Add to Cart
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Grain Boundaries: Their Microstructure and Chemistry
by P. E. J. Flewitt, R. K. Wild
May 2001, Hardcover
US $380.00 Add to Cart
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Handbook of Monochromatic XPS Spectra, The Elements of Native Oxides
by B. Vincent Crist
October 2000, Hardcover
US $1,320.00 Add to Cart
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Handbook of Monochromatic XPS Spectra, Semiconductors
by B. Vincent Crist
October 2000, Hardcover
US $1,300.00 Add to Cart
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Handbook of Monochromatic XPS Spectra, Polymers and Polymers Damaged by X-Rays
by B. Vincent Crist
October 2000, Hardcover
US $1,300.00 Add to Cart
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Handbook of Monochromatic XPS Spectra, 3 Volume Set
by B. Vincent Crist
October 2000, Hardcover
US $3,600.00 Add to Cart
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Inorganic Materials Synthesis and Fabrication
by John N. Lalena, David A. Cleary, Everett Carpenter, Nancy F. Dean
January 2008, Hardcover (E-Book also available)
US $99.95 Add to Cart
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Introduction to Diffraction in Materials Science and Engineering
by Aaron D. Krawitz
April 2001, Hardcover
US $152.50 Add to Cart
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An Introduction to Surface Analysis by XPS and AES
by John F. Watts, John Wolstenholme
May 2003, Paperback
US $85.00 Add to Cart
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Magnetic Circular Dichroism Spectroscopy
by W. Roy Mason
July 2007, Hardcover (E-Book also available)
US $130.00 Add to Cart
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Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
by Yang Leng
June 2008, Hardcover
US $110.00 Add to Cart
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Microstructural Characterization of Materials, 2nd Edition
by David D. Brandon, Wayne D. Kaplan
June 2008, Paperback
US $80.00 Add to Cart
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Microstructural Characterization of Materials, 2nd Edition
by David D. Brandon, Wayne D. Kaplan
July 2008, Hardcover
US $200.00 Add to Cart
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Nanoscale Calibration Standards and Methods: Dimensional and Related Measurements in the Micro- and Nanometer Range
by Günter Wilkening, Ludger Koenders
August 2005, Hardcover
US $230.00 Add to Cart
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