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1 matches for "Alan R. Krauss"

In Situ Real-Time Characterization of Thin Films (0471241415) cover image

In Situ Real-Time Characterization of Thin Films

by Orlando Auciello (Editor), Alan R. Krauss (Editor)

November 2000, Hardcover

US $160.00

Related Subjects

Mechanical Engineering Failure Fracture

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