Wiley
Wiley.com

Search Results

Refine: Sort by:

1 matches for "Alvin W. Strong"

Reliability Wearout Mechanisms in Advanced CMOS Technologies (0471731722) cover image
by Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch, III
August 2009, Hardcover (E-book also available)
US $177.00 Buy