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1 matches for "Ernest Y. Wu"
Reliability Wearout Mechanisms in Advanced CMOS Technologies
by Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch, III
August 2009
,
Hardcover
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also available)
Related Subjects
Quality & Reliability
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