by Shashi Phoha (Editor), Thomas F. La Porta (Editor), Christopher Griffin (Editor)
by French College of Metrology, Dominique Placko (Series Editor)
by Daniel Balageas (Editor), Claus-Peter Fritzen (Editor), Alfredo Güemes (Editor)
by Dennis D. McCarthy, P. Kenneth Seidelmann
by Waldemar Minkina, Sebastian Dudzik
by David Prutchi, Michael Norris
by Gerard Meijer (Editor)
by Ralf B. Wehrspohn (Editor), Heinz-Siegfried Kitzerow (Editor), Kurt Busch (Editor)
by Branko Glisic, Daniele Inaudi
by H. Anthony Chan (Editor)
May 2001, Hardcover, Wiley-IEEE Press
by Xavier P. Maldague
April 2001, Hardcover
by W. Prasad Kodali
January 2001, Hardcover, Wiley-IEEE Press
by Mark I. Montrose
July 2000, Hardcover, Wiley-IEEE Press
by Patrick H. Garrett
January 2000, Paperback, Wiley-IEEE Press
by Joseph F. Keithley
January 1999, Paperback, Wiley-IEEE Press
by Mark I. Montrose
September 1998, Hardcover, Wiley-IEEE Press