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Introductory Bioelectronics: For Engineers and Physical Scientists (1119970873) cover image
Introductory Bioelectronics: For Engineers and Physical Scientists
by Ronald R. Pethig, Stewart Smith
November 2012, ©2012
Forthcoming
Fundamentals of Pervasive Information Management Systems, 2nd Edition (1118024249) cover image
Fundamentals of Pervasive Information Management Systems, 2nd Edition
by Vijay Kumar
August 2013
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All Titles in Sensors, Instrumentation & Measurement (88)

The Story of Electrical and Magnetic Measurements: From 500 BC to the 1940s (0780311930) cover image
The Story of Electrical and Magnetic Measurements: From 500 BC to the 1940s
by Joseph F. Keithley
January 1999, Paperback, Wiley-IEEE Press
EMC and the Printed Circuit Board: Design, Theory, and Layout Made Simple (078034703X) cover image
EMC and the Printed Circuit Board: Design, Theory, and Layout Made Simple
by Mark I. Montrose
September 1998, Hardcover, Wiley-IEEE Press
US $150.00 Add to Cart
Spatial Error Analysis: A Unified Application-Oriented Treatment (0780334531) cover image
Spatial Error Analysis: A Unified Application-Oriented Treatment
by David Y. Hsu
September 1998, Hardcover, Wiley-IEEE Press
Engineering Networks for Synchronization, CCS 7, and ISDN: Standards, Protocols, Planning and Testing (0780311582) cover image
Engineering Networks for Synchronization, CCS 7, and ISDN: Standards, Protocols, Planning and Testing
by P. K. Bhatnagar
June 1997, Hardcover, Wiley-IEEE Press
Inspection of Large Synchronous Machines: Checklists, Failure Identification, and Troubleshooting (0780311485) cover image
Inspection of Large Synchronous Machines: Checklists, Failure Identification, and Troubleshooting
by Isidor Kerszenbaum
May 1996, Hardcover, Wiley-IEEE Press
Semiconductor Sensors (0471546097) cover image
Semiconductor Sensors
by Simon M. Sze (Editor)
October 1994, Hardcover
Engineering Applications of Correlation and Spectral Analysis, 2nd Edition (0471570559) cover image
Engineering Applications of Correlation and Spectral Analysis, 2nd Edition
by Julius S. Bendat, Allan G. Piersol
March 1993, Hardcover
The Physics of Moire Metrology (0471509671) cover image
The Physics of Moire Metrology
by Oded Kafri, Ilana Glatt
January 1990, Hardcover
US $170.00 Add to Cart
Handbook of Checked Baggage Screening: Advanced Airport Security Operation (1860584284) cover image
Handbook of Checked Baggage Screening: Advanced Airport Security Operation
by Norman E. L. Shanks, Alexandre L. W. Bradley
August 2005, Hardcover
US $210.00 Add to Cart
Ambient Vibration Monitoring (0470024305) cover image
Ambient Vibration Monitoring
by Helmut Wenzel, Dieter Pichler
May 2005, Hardcover (E-book also available)
Handbook of Measuring System Design, 3 Volume Set (0470021438) cover image
Handbook of Measuring System Design, 3 Volume Set
by Peter Sydenham (Editor-in-Chief), Richard Thorn (Editor-in-Chief)
March 2005, Hardcover
US $1,745.00 Add to Cart
Radioisotope Gauges for Industrial Process Measurements (0471489999) cover image
Radioisotope Gauges for Industrial Process Measurements
by Geir Anton Johansen, Peter Jackson
July 2004, Hardcover (E-book also available)
US $215.00 Add to Cart
Sensors, A Comprehensive Survey, Volume 7, Mechanical Sensors (3527620729) cover image
E-book
Sensors, A Comprehensive Survey, Volume 7, Mechanical Sensors
by H. Bau (Editor), N. F. DeRooij (Editor), B. Kloeck (Editor)
November 2008, E-book
Sensors, A Comprehensive Survey, Volume 8, Micro- and Nanosensor Technology: Trends in Sensor Markets (3527620613) cover image
E-book
Sensors, A Comprehensive Survey, Volume 8, Micro- and Nanosensor Technology: Trends in Sensor Markets
by Robert Jones (Editor), Hans Meixner
July 2008, E-book
Nuclear Electronics: Superconducting Detectors and Processing Techniques (0470857595) cover image
Nuclear Electronics: Superconducting Detectors and Processing Techniques
by Vladimir Polushkin
June 2004, Hardcover (E-book also available)
US $200.00 Add to Cart
Microwave Electronics: Measurement and Materials Characterization (0470844922) cover image
Microwave Electronics: Measurement and Materials Characterization
by L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, Vijay K. Varadan
April 2004, Hardcover (E-book also available)
Wiley Survey of Instrumentation and Measurement (0471221651) cover image
E-book
Wiley Survey of Instrumentation and Measurement
by Stephen A. Dyer
April 2004, E-book, Wiley-IEEE Press
Optical Metrology, 3rd Edition (0470843004) cover image
Optical Metrology, 3rd Edition
by Kjell J. Gåsvik
October 2002, Hardcover (E-book also available)
Temperature Measurement , 2nd Edition (0471867799) cover image
Temperature Measurement , 2nd Edition
by L. Michalski, K. Eckersdorf, J. Kucharski, J. McGhee
December 2001, Hardcover
Traceable Temperatures: An Introduction to Temperature Measurement and Calibration, 2nd Edition (0471492914) cover image
Traceable Temperatures: An Introduction to Temperature Measurement and Calibration, 2nd Edition
by J. V. Nicholas, D. R. White
December 2001, Hardcover
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