 Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
ISBN: 978-0-470-82298-2
Hardcover
384 pages
June 2008
US $110.00
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Part One – Microstructure Examinations
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Light microscopy
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X-ray diffraction methods
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Transmission electron microscopy
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Scanning electron microscopy
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Scanning probe microscopy
Part Two—Chemical and Thermal Analysis
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X-Ray Spectroscopy for Elemental Analysis
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Electron Spectroscopy for Surface Analysis
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Secondary Ion Mass Spectrometry for Surface Analysis
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Vibrational Spectroscopy for Molecular Analysis
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Thermal analysis
