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An Introduction to Surface Analysis by XPS and AES
ISBN: 978-0-470-84713-8
Paperback
224 pages
May 2003
US $85.00 Add to Cart

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  • Description
  • Table of Contents
  • Author Information
Preface.

Acknowledgements.

Electron Spectroscopy: Some Basic Concepts.

Electron Spectrometer Design.

The Electron Spectrum: Qualitative and Quantitative Interpretation.

Compositional Depth Profiling.

Applications of Electron Spectroscopy in Materials Science.

Comparison of XPS and AES with Other Analytical Techniques.

Glossary.

Bibliography.