![]() An Introduction to Surface Analysis by XPS and AES
ISBN: 978-0-470-84713-8
Paperback
224 pages
May 2003
US $99.95
This price is valid for United States. Change location to view local pricing and availability. This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 2-3 days delivery time. The book is not returnable.
|
An online version of this product is available through our subscription-based content service. Visit Wiley Online Library now |
Preface.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative Interpretation.
Compositional Depth Profiling.
Applications of Electron Spectroscopy in Materials Science.
Comparison of XPS and AES with Other Analytical Techniques.
Glossary.
Bibliography.
Acknowledgements.
Electron Spectroscopy: Some Basic Concepts.
Electron Spectrometer Design.
The Electron Spectrum: Qualitative and Quantitative Interpretation.
Compositional Depth Profiling.
Applications of Electron Spectroscopy in Materials Science.
Comparison of XPS and AES with Other Analytical Techniques.
Glossary.
Bibliography.



Share This