 SiGe, GaAs, and InP Heterojunction Bipolar Transistors
ISBN: 978-0-471-19746-1
Hardcover
488 pages
April 1999
US $155.50
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Material Properties and Technologies.
DC Performance.
RF and Transient Performance.
HBT Modeling.
Heterojunction Device Simulation.
Breakdown and Thermal Instability.
Reliability.
RF and Digital Circuits for Low-Voltage Applications.
Index.
DC Performance.
RF and Transient Performance.
HBT Modeling.
Heterojunction Device Simulation.
Breakdown and Thermal Instability.
Reliability.
RF and Digital Circuits for Low-Voltage Applications.
Index.
