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In Situ Real-Time Characterization of Thin Films

Orlando Auciello (Editor), Alan R. Krauss (Editor)
ISBN: 978-0-471-24141-6
Hardcover
280 pages
November 2000
US $160.00 Add to Cart

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In Situ Real-Time Characterization of Thin Films (0471241415) cover image

ORLANDO AUCIELLO, PhD, is a Senior Scientist at the Argonne National Laboratory. ALAN R. KRAUSS, PhD, (deceased) was a Senior Scientist at the Argonne National Laboratory.

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In Situ Real-Time Characterization of Thin Films (US $160.00)

-and- Damage Mechanics of Cementitious Materials and Structures (US $127.00)

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