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Characterization of Materials, 2 Volume Set

ISBN: 978-0-471-26882-6
1392 pages
January 2003
Characterization of Materials, 2 Volume Set (0471268828) cover image
Characterization of Materials (formerly Methods in Materials Research) provides comprehensive up-to-date coverage of materials characterization techniques including computational and theoretical methods as well as crystallography, mechanical testing, thermal analysis, optical imaging and spectroscopy, and more.

Editor-in-Chief, Elton Kaufmann, Ph.D. is Associate Director of the Strategic Planning Group at the Argonne National Laboratory and has published approximately 100 technical papers in refereed journals and books.

Dr. Kaufmann has assembled leading experts from academia, government, and industry to provide:
* A comprehensive up-to-date collection of methods used in the characterization of materials
* Articles on various methods from standard to cutting edge
* Periodic online updates to keep pace with latest developments
* A user-friendly format that is easy and simple to search and navigate

Characterization of Materials is a collection of characterization methods that is widely applicable in the wide and diverse field of materials research irrespective of discipline or ultimate application and with which researchers, engineers, and educators must have familiarity.

Methods covered include:
* General Vacuum Techniques
* X-Ray Powder Diffraction
* High Strain Rate Testing
* Deep Level Transient Spectroscopy
* Cyclic Voltammetry
* Extended X-Ray Absorption Fine Structure
* Low Energy Electron Diffraction
* Thermogravimetric Analysis
* Magnetometry
* Transmission Electron Microscopy
* Ultraviolet Photoelectron Spectroscopy

This reference work is also available as a convenient online edition. For information regarding the online edition, please visit: www.mrw.interscience.wiley.com/com
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Forward
Preface
Contributors
COMMON CONCEPTS
Introduction
General Vacuum Techniques
Mass and Density Measurements
Thermometry
Symmetry in Crystallography
Particle Scattering
Sample Preparation for Metallography
COMPUTATION AND THEORETICAL METHODS
Introduction
Introduction to Computation
Summary of Electronic Structure Methods
Prediction of Phase Diagrams
Simulation of Microstructural Evolution Using the Field Method
Bonding in Metals
Binary and Multicomponent Diffusion
Molecular-Dynamics Simulation of Surface Phenomena
Simulation of Chemical Vapor Deposition Processes
Magnetism in Alloys
Kinematic Diffraction of X-Rays
Dynamical Diffraction
Computation of Diffuse Intensities in Alloys
MECHANICAL TESTING
Introduction
Tension Testing
High-Strain-Rate Testing of Materials
Fracture Toughness Testing Methods
Hardness Testing
Tribological and Wear Testing
THERMAL ANALYSIS
Introduction
Thermal Analysis -
Definitions, Codes of Practice, and Nomenclature
Thermogravimetric Analysis
Differential Thermal Analysis and Differential Scanning Calorimetry
Combustion Calorimetry
Thermal Diffusivity by the Laser Flash Technique
Simultaneous Techniques Including Analysis of Gaseous Products
ELECTRICAL AND ELECTRONIC MEASUREMENT
Introduction
Conductivity Measurement
Hall Effect in Semiconductors
Deep-Level Transient Spectroscopy
Carrier Lifetime: Free Carrier Absorption, Photoconductivity, and Photoluminescence
Capacitance-Voltage (C-V) Characterization of Semiconductors
Characterization of pn Junctions
MAGNETISM AND MAGNETIC MEASUREMENT
Introduction
Generation and Measurement of Magnetic Fields
Magnetic Moment and Magnetization
Theory of Magnetic Phase Transitions
Magnetometry
Thermomagnetic Analysis
Techniques to Measure Magnetic Domain Structures
Magnetotransport in Metals and Alloys
Surface Magneto-Optic Kerr Effect
ELECTROCHEMICAL TECHNIQUES
Introduction
Cyclic Voltammetry
Electrochemical Techniques for Corrosion Quantification
Semiconductor Electrochemistry
Scanning Electrochemical Microscopy
The Quartz Crystal Microbalance in Electrochemistry
OPTICAL IMAGING AND SPECTROSCOPY
Introduction
Optical Microscopy
Reflected-Light Optical Microscopy
Photoluminescence Spectroscopy
Ultraviolet and Visible Absorption Spectroscopy
Raman Spectroscopy of Solids
Ultraviolet Photoelectron Spectroscopy
Ellipsometry
Impulsive Stimulated Thermal Scattering
RESONANCE METHODS
Introduction
Nuclear Magnetic Resonance Imaging
Nuclear Quadrupole Resonance
Electron Paramagnetic Resonance Spectroscopy
Cyclotron Resonance
Mössbauer Spectrometry
X-RAY TECHNIQUES
Introduction
X-Ray Powder Diffraction
XAFS Spectroscopy
X-Ray and Neutron Diffuse Scattering Measurements
Resonant Scattering Techniques
Magnetic X-Ray Scattering
X-Ray Microprobe for Fluorescence and Diffraction Analysis
X-Ray Magnetic Circular Dichroism
Surface X-Ray Diffraction
X-Ray Diffraction Techniques for Liquid Surfaces and Monomolecular Layers
ELECTRON TECHNIQUES
Introduction
Scanning Electron Microscopy
Transmission Electron Microscopy
Scanning Transmission Electron Microscopy: Z-Contrast Imaging
Scanning Tunneling Microscopy
Low-Energy Electron Diffraction
Energy-Dispersive Spectrometry
Auger Electron Spectroscopy
ION-BEAM TECHNIQUES
Introduction
High Energy Ion-Beam Analysis
Elastic Ion Scattering for Composition Analysis
Nuclear Reaction Analysis and Proton-Induced Gamma Ray Emission
Particle-Induced X-Ray Emission
Radiation Effects Microscopy
Trace Element Accelerator Mass Spectrometry
Introduction to Medium-Energy Ion Beam Analysis
Medium-Energy Backscattering and Forward-Recoil Spectrometry
Heavy-Ion Backscattering Spectrometry
NEUTRON TECHNIQUES
Introduction
Neutron Powder Diffraction
Single-Crystal Neutron Diffraction
Phonon Studies
Magnetic Neutron Scattering
Appendices
Index
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Dr. Kaufmann is Associate Director of the Strategic Planning Group at the Argonne National Laboratory, Argonne, Illinois. He is concurrently a physicist with the Materials Science Division at Argonne. He has been with Argonne since 1989 and has served in several positions.
Dr. Kaufmann holds a B.Sc. in Physics from the Rensselaer Polytechnic Institute, Troy, New York and a Ph.D. from California Institute of Technology, Pasadena, California, where he was also a Post-Doctoral Research Assistant. Prior to joining Argonne, Dr. Kaufmann was with Lawrence Livermore National Laboratory, Livermore, California in the Chemistry and Materials Science Department as a Division Leader of Materials, and he was also with the Bell Telephone Laboratories, Murray Hill, New Jersey as a member of the Radiation Physics Research Department.
Dr. Kaufmann is a member of the Materials Research Society in which he held several positions including President (1985). He is also a member of The Minerals, Metals and Materials Society, the American Association for the Advancement of Science, as well as a Fellow of the American Physical Society.
He was Program Chair/Organizer of the Joint ISTEC/MRS International Workshops on High Temperature Superconductivity 5 times, Secretary of the International Union of Materials Research Societies (2001-2002), Chair of the Commission on Publications of the International Union of Materials Research Societies (1998-present), and Executive Editor of the periodical IUMRS Facets among other activities.
Dr. Kaufmann has published approximately 100 technical papers in refereed journals and books and has served as co-editor of two proceeding volumes. His Avocations are writing, editing, and fine art photography.
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"...all in all, a worthwhile addition to your bookshelf..." (Journal of Materials Technology, Vol 18(3), Autumn 2003)

“...a much needed addition tot he vast literature on materials science...pharmaceutical scientists will find it a most welcome addition to their library...written by several outstanding contributors...the book is well integrated, complete, and especially balanced...Highly recommended!” (Pharmaceutical Research, Vol. 20, No. 12, December 2003)

"...useful to the materials scientist as a starting point for a huge number of characterization techniques..." (Polymer News)

"...an outstanding sourcebook...with numerous references...and excellent descriptions...this reference book is an excellent source for practical materials research measurement techniques." (IEEE Electrical Insulation Magazine, Vol. 19, No. 4, July-August 2003)

"Overall the set contains important and concise descriptions of techniques that are otherwise very difficult to find…Highly recommended..." (Choice, September 2003)

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