WILEY

KNOWLEDGE FOR GENERATIONS

WILEY - KNOWLEDGE FOR GENERATIONS

United States Change Location

cart.gif CART |  MY ACCOUNT |  CONTACT US |  HELP    
Cover image for product 0471305243
Total-Reflection X-Ray Fluorescence Analysis
ISBN: 978-0-471-30524-8
Hardcover
245 pages
November 1996
US $143.50 Add to Cart

This price is valid for United States. Change location to view local pricing and availability.

This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 1-2 days delivery time for paperbacks, and 3-5 days for hardcovers. The book is not returnable.
  • Description
  • Table of Contents
  • Author Information
REINHOLD KLOCKENKÄMPER heads the Physical Analysis Research Group at the Institut für Spektro-chemie und angewandte Spektro-skopie and is Associate Lecturer at the Fachhochschule in Dortmund, Germany. His experience in X-ray spectral analysis spans three decades, and he has published over 80 papers, reviews, and book articles. Professor Klockenkämper's research interests include micro-distribution and surface-layer analysis in general, and micro- and trace analysis by total-reflection X-ray fluorescence in particular.