 Physical Methods of Chemistry, Volume 9, Part B, Investigations of Surfaces and Interfaces, 2nd Edition
ISBN: 978-0-471-54405-0
Hardcover
768 pages
June 1993
US $525.00
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Surface Crystallography by Low-Energy Electron Diffraction (G. Somorjai & M. Van Hove).
Analysis of Surfaces by Auger Electron Spectroscopy and Related Techniques (L. Kazmerski).
The Analysis of Surfaces by X-Ray Photoelectron Spectroscopy (N. Turner).
Low-Energy Ion Scattering and Rutherford Backscattering Spectroscopies (A. Miller, et al.).
X-Ray Absorption Spectroscopy (Surface Extended and Near-Edge X-Ray Absorption Fine Structure) at Surfaces (D. Norman).
Monolayer Assemblies (H. Kuhn & D. Mobius).
Applications of Spectroscopic Techniques to the In Situ Study of Electrochemical Interfaces (D. Scherson & E. Yeager).
Surface-Enhanced Raman Scattering (E. Brandt & T. Cotton).
Index.
Analysis of Surfaces by Auger Electron Spectroscopy and Related Techniques (L. Kazmerski).
The Analysis of Surfaces by X-Ray Photoelectron Spectroscopy (N. Turner).
Low-Energy Ion Scattering and Rutherford Backscattering Spectroscopies (A. Miller, et al.).
X-Ray Absorption Spectroscopy (Surface Extended and Near-Edge X-Ray Absorption Fine Structure) at Surfaces (D. Norman).
Monolayer Assemblies (H. Kuhn & D. Mobius).
Applications of Spectroscopic Techniques to the In Situ Study of Electrochemical Interfaces (D. Scherson & E. Yeager).
Surface-Enhanced Raman Scattering (E. Brandt & T. Cotton).
Index.
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