 Electromigration and Electronic Device Degradation
ISBN: 978-0-471-58489-6
Hardcover
343 pages
December 1993
US $196.50
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Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
