![]() Semiconductor Material and Device Characterization, 3rd Edition
ISBN: 978-0-471-73906-7
Hardcover
800 pages
January 2006, Wiley-IEEE Press
US $145.95
This price is valid for United States. Change location to view local pricing and availability. Other Available Formats: Adobe E-Book
|
An online version of this product is available through our subscription-based content service. Visit Wiley InterScience now |
DIETER K. SCHRODER, PhD, is Professor, Department of Electrical Engineering, Arizona State University. He is a recipient of the ASU College of Engineering Teaching Excellence Award and several other teaching awards. In addition to Semiconductor Material and Device Characterization, Dr. Schroder is the author of Advanced MOS Devices.
Buy Both and Save 20%!
| + |
Buy Semiconductor Material and Device Characterization, 3rd Edition
(List Price: US $145.95)
with Fundamentals of Semiconductor Manufacturing and Process Control (List Price = US $90.50) Cannot be combined with any other offers. Learn more. |


