WILEY

KNOWLEDGE FOR GENERATIONS

WILEY - KNOWLEDGE FOR GENERATIONS

United States Change Location

cart.gif CART |  MY ACCOUNT |  CONTACT US |  HELP    
Cover image for product 0780310004
Semiconductor Memories: Technology, Testing, and Reliability
ISBN: 978-0-7803-1000-1
Hardcover
480 pages
September 2002, Wiley-IEEE Press
US $150.00 Add to Cart

This price is valid for United States. Change location to view local pricing and availability.

This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 1-2 days delivery time for paperbacks, and 3-5 days for hardcovers. The book is not returnable.
  • Description
  • Table of Contents
  • Reviews
"...a valuable reference..." (Microelectronics Reliability, Vol. 43, 2003)