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Semiconductor Memories: Technology, Testing, and Reliability
ISBN: 978-0-7803-1000-1
Hardcover
480 pages
September 2002, Wiley-IEEE Press
US $150.00 Add to Cart

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  • Description
  • Table of Contents
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Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including.
* Memory cell structures and fabrication technologies.
* Application-specific memories and architectures.
* Memory design, fault modeling and test algorithms, limitations, and trade-offs.
* Space environment, radiation hardening process and design techniques, and radiation testing.
* Memory stacks and multichip modules for gigabyte storage.

This Title is Part of the Following Set

by Ashok K. Sharma
US $252.50 Add to Cart