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Digital Systems Testing and Testable Design
ISBN: 978-0-7803-1062-9
Hardcover
672 pages
September 1994, Wiley-IEEE Press
US $135.95 Add to Cart
  • Description
  • Table of Contents
  • Author Information
Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.

All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.