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Nonvolatile Semiconductor Memory Technology: A Comprehensive Guide to Understanding and Using NVSM Devices
William D. Brown (Editor), Joe Brewer (Editor)
ISBN: 978-0-7803-1173-2
Hardcover
590 pages
October 1997, Wiley-IEEE Press
US $172.00 Add to Cart
This is a Print-on-Demand title. It will be printed specifically to fill your order. Please allow an additional 1-2 days delivery time for paperbacks, and 3-5 days for hardcovers. The book is not returnable.
  • Description
  • Table of Contents
  • Author Information
List of Contributors.

List of Acronyms.

Foreword.

Basics of Nonvolatile Semiconductor Memory Devices (G. Groeseneken, et al.).

Floating Gate Planar Devices (H. Lin & R. Ramaswami).

Floating Gate Nonplanar Devices (H. Wegener & W. Owen).

Floating Gate Flash Devices (M. Gill & S. Lai).

SONOS Nonvolatile Semiconductor Memories (M. White & F. Libsch).

Reliability and NVSM Reliability (Y. Hsia & V. Tyree).

Radiation Tolerance (G. Messenger).

Procurement Considerations (D. Sweetman).

Bibliography (W. Brown).

Index.

Editors' Biographies.

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