X-Ray Diffraction by Polycrystalline Materials
March 2007, Wiley-ISTE
An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction.
Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
An Historical Introduction: The Discovery of X-rays and the First Studies in X-ray Diffraction.
Part 1. Basic Theoretical Elements, Instrumentation and Classical Interpretations of the Results.
Chapter 1. Kinematic and geometric theories of X-ray diffraction.
Chapter 2. Instrumentation used for X-ray diffraction.
Chapter 3. Data processing, extracting information.
Chapter 4. Interpreting the results.
5. Scattering and diffraction on imperfect crystals.
Part 2. Microstructual Analysis.
Chapter 6. Microstructural study of randomly oriented polycrystalline samples.
Chapter 7. Microstructural study of thin films.