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Reliability of MEMS: Testing of Materials and Devices, Volume 6

Oliver Brand (Series Editor), Gary K. Fedder (Series Editor), Christofer Hierold (Series Editor), Jan G. Korvink (Series Editor), Osamu Tabata (Editor), Toshiyuki Tsuchiya (Editor)
ISBN: 978-3-527-31494-2
Hardcover
324 pages
February 2008
US $280.00 Add to Cart

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Reliability of MEMS: Testing of Materials and Devices, Volume 6 (3527314946) cover image
Other Available Formats: Paperback

"The book will undoubtedly be of interest to MEMS practitioners and researchers." (Journal of Applied Electrochemistry, February 2008)

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Reliability of MEMS: Testing of Materials and Devices, Volume 6 (US $280.00)

-and- Scaling Issues and Design of MEMS (US $140.00)

Total List Price: US $420.00
Discounted Price: US $315.00 (Save: US $105.00)

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