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In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

Gerhard Dehm (Editor), James M. Howe (Editor), Josef Zweck (Editor)
ISBN: 978-3-527-31973-2
Hardcover
402 pages
May 2012
US $210.00 Add to Cart

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In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science (3527319735) cover image
Other Available Formats: E-book

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers
real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information
on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

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In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science (US $210.00)

-and- Aberration-corrected Analytical Electron Microscopy (US $65.00)

Total List Price: US $275.00
Discounted Price: US $206.25 (Save: US $68.75)

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