Exploring Scanning Probe Microscopy with MATHEMATICA, 2nd, Revised and Enlarged EditionISBN: 978-3-527-40617-3
Hardcover
310 pages
April 2007
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1 Introduction
2 Uniform Cantilevers
3 Cantilever Conversion Tables
4 V-Shaped Cantilevers
5 Tip Sample Adhesion
6 Tip Sample Force Curve
7 Free Vibrations
8 Noncontact Mode
9 Tapping Mode
10 Metal-Insulator-Metal Tunneling
11 Fowler-Nordheim Tunneling
12 Scanning Tunneling Spectroscopy
13 Coulomb Blockade
14 Density of States
15 Electrostatics
16 Near-Field Optics
17 Constriction and Boundary Resistence
18 Scanning Thermal Conductivity Microscopy
19 Kelvin Probe Force Microscopy
20 Raman Scattering in Nanocrystals
2 Uniform Cantilevers
3 Cantilever Conversion Tables
4 V-Shaped Cantilevers
5 Tip Sample Adhesion
6 Tip Sample Force Curve
7 Free Vibrations
8 Noncontact Mode
9 Tapping Mode
10 Metal-Insulator-Metal Tunneling
11 Fowler-Nordheim Tunneling
12 Scanning Tunneling Spectroscopy
13 Coulomb Blockade
14 Density of States
15 Electrostatics
16 Near-Field Optics
17 Constriction and Boundary Resistence
18 Scanning Thermal Conductivity Microscopy
19 Kelvin Probe Force Microscopy
20 Raman Scattering in Nanocrystals
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Exploring Scanning Probe Microscopy with MATHEMATICA, 2nd, Revised and Enlarged Edition (US $250.00)
-and- Explosive Boiling of Superheated Cryogenic Liquids (US $273.00)
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