 Exploring Scanning Probe Microscopy with MATHEMATICA, 2nd, Revised and Enlarged Edition
ISBN: 978-3-527-40617-3
Hardcover
310 pages
March 2007
US $200.00
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1 Introduction.
2 Uniform Cantilevers.
3 Cantilever Conversion Tables.
4 V-Shaped Cantilevers.
5 Tip Sample Adhesion.
6 Tip Sample Force Curve.
7 Free Vibrations.
8 Noncontact Mode.
9 Tapping Mode.
10 Metal-Insulator-Metal Tunneling.
11 Fowler-Nordheim Tunneling.
12 Scanning Tunneling Spectroscopy.
13 Coulomb Blockade.
14 Density of States.
15 Electrostatics.
16 Near-Field Optics.
17 Constriction and Boundary Resistence.
18 Scanning Thermal Conductivity Microscopy.
19 Kelvin Probe Force Microscopy.
20 Raman Scattering in Nanocrystals.
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