Advanced Calculations for Defects in Materials
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The editors are well known authorities in this field, and very knowledgeable of past developments as well as current advances. In turn, they have selected respected scientists as chapter authors to provide an expert view of the latest advances.
The result is a clear overview of the connections and boundaries between these methods, as well as the broad criteria determining the choice between them for a given problem. Readers will find various correction schemes for the supercell model, a description of alternatives by applying embedding techniques, as well as algorithmic improvements allowing the treatment of an ever larger number of atoms at a high level of sophistication.
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Advanced Calculations for Defects in Materials (US $175.00)
-and- Advanced Characterization Techniques for Thin Film Solar Cells (US $160.00)
Total List Price: US $335.00
Discounted Price: US $251.25 (Save: US $83.75)