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Electron Microscopy: Principles and Fundamentals

S. Amelinckx (Editor), Dirk van Dyck (Editor), J. van Landuyt (Editor), Gustaaf van Tendeloo (Editor)
ISBN: 978-3-527-61455-4
527 pages
September 2008
Electron Microscopy: Principles and Fundamentals (3527614559) cover image


Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.

Topics include:
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy

Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
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Table of Contents

Transmission Electron Microscopy
Reflection Electro Microscopy
Electron Energy Loss Spectroscopy
High-Voltage Electron Microscopy
Convergent Electron Beam Diffraction
Low Energy Electron Microscopy
Lorentz Microscopy
Electron holographic Methods
Scanning Reflection Electron Microscopy
Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy: Z-Contrast
Scanning Auger and XPS Microscopy
Scanning Microanalysis
Imaging Secondary Ion Mass Spectrometry
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