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Nanoscale Characterization of Surfaces and Interfaces

ISBN: 978-3-527-61594-0
173 pages
September 2008
Nanoscale Characterization of Surfaces and Interfaces (3527615946) cover image

Description

Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.

Topics include:
Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale

Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information
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Table of Contents

Introduction
Scanning Tunneling Microscopy (STM)
Atomic Force Microscopy/
Manipulation of Atoms and Atom Clusters on the Nanoscale
Spin.Offs of STM -
Non-Contact Nanoscale Probes
Acknowledgements
References
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