Find a Wiley book:
(enter title, author, or keywords)

Find a Wiley journal:
(enter title words)


Wiley General Catalog

Wiley-VCH
Science Catalog

Wiley InterScience
Online Journals


The Wiley
Encyclopedia of Electrical and Electronics Engineering

(24-Volume Set)

Editor-in-Chief: John G. Webster, Ph.D.


  • Main Page for this Work
  • Table of Contents
  • List of Contributors



  • Available Online
    EEEE Online

    ISBN: 0-471-13946-7
    Hardcover
    Pages: 17,616
    Published: March 1999

    Editorial Board

    Ron Clinton Andrews, Ph.D.
    Rutgers University, New Brunswick, NJ

    John Baillieul, Ph.D.
    Boston University, Boston, MA

    Jim Bezdek, Ph.D.
    University of West Florida, Pensacola, FL

    Richard E. Blahut, Ph.D.
    University of Illinois, Urbana, IL

    Alexander T. Bulinski, Ph.D.
    National Research Council of Canada
    Ottawa, ON, Canada

    William M. Cary, Ph.D.
    Editor, Journal of Oceanic Engineering, Old Lyme, CT

    J. R. Cruz, Ph.D.
    University of Oklahoma, Norman, OK

    Clarence W. de Silva, Ph.D., P. Engr.
    The University of British Columbia,
    Vancouver, BC, Canada

    Edward Della Torre, D.E.Sc.
    George Washington University, Washington, D.C.

    Joseph Dudor, Ph.D.
    Consultant, Midway City, CA

    Stephen A. Dyer, Ph.D.
    Kansas State University, Manhattan, KS

    Bill Grosky, Ph.D.
    Wayne State University, Detroit, MI

    Martin Hasler, Ph.D.
    Swiss Federal Institute of Technology Lausanne (EPFL)
    Lausanne, Switzerland

    Dr. Richard G. Hoft, Ph.D.
    Iowa State University, Ames, IA

    E. Bruce Hunter, B.S.E.E./M.B.A.
    USIA Information Agency
    International Boadcasting Bureau, Greenville, NC

    Renuka P. Jindal, Ph.D.
    Bell Laboratories, Lucent Technologies, Princeton, NJ

    Dan Kahn, Ph.D.
    E-Speech Corporation, Gillette, NJ

    Motohisa Kanda, Ph.D.
    University of Colorado, Boulder, CO

    Rangachar Kasturi, Ph.D.
    Texas Tech University, Lubbock, TX

    Arie E. Kaufman, Ph.D.
    State University of New York at Stony Brook
    Stony Brook, NY

    Curt A. Levis, Ph.D.
    Ohio State University, Columbus, OH

    Malgorzata Marek-Sadowska, Ph.D.
    University of California, Santa Barbara, CA

    Ronald J. Marhefka, Ph.D.
    Ohio State University, Columbus, OH

    Daniel Masse
    Retired, Wapole, MA

    Gary S. May, Ph.D.
    Georgia Institute of Technology, Atlanta, GA

    James Miller, M.S.E.E.
    Gamma-Metrics, San Diego, CA

    G. Marshall Molen, Ph.D.
    Mississippi State University, Mississippi, MS

    Joan G. Nagle, B.S.
    Retired, Aiken, SC

    Michael R. Neuman, Ph.D., M.D.
    University of Memphis, Memphis, TN

    William D. O'Brien, Jr., Ph.D.
    University of Illinois, Urbana, IL

    David A. Padua, Ph.D.
    University of Illinois, Urbana, IL

    Michael Pecht, Ph.D.
    University of Wisconsin, Madison, WI

    Raymond L. Pickholtz
    George Washington University, Washington, DC

    Ramu V. Ramaswamy, Ph.D.
    University of Florida, Gainesville, FL

    Andrew P. Sage, Ph.D., D.Engr.
    George Mason University, Fairfax, VA

    Edgar Sanchez-Sinencio, Ph.D.
    Texas A&M University, College Station, TX

    Phillip A. Sanger, Ph.D.
    Northrop Grumman Corporation
    Science Technology Center, Pittsburgh, PA

    Bing J. Sheu, Ph.D.
    University of Southern California, Los Angeles, CA

    James A. Smith, Ph.D.
    NASA Goddard Space Flight Center, Greenbelt, MD

    John Stafford, M.S.
    Motorola, Consumer Systems Group, Tempe, AZ

    Tatsuya Suda, Ph.D.
    University of California, Irvine, CA

    Earl E. Swartzlander, Jr., Ph.D.
    University of Texas, Austin, TX

    Russell H. Taylor, Ph.D.
    Johns Hopkins University, Baltimore, MD

    Michael W. Vannier, M.D.
    University of Iowa, Iowa City, IA

    Benjamin W. Wah, Ph.D.
    University of Illinois, Urbana-Champaign, Urbana, IL

    John W. Woods, Ph.D.
    Massachusetts Institute of Technology, Cambridge, MA


  • Main Page for this Work
  • Table of Contents
  • List of Contributors


  • This Web site Copyright ® 1999 John Wiley & Sons, Inc. All rights reserved.