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X-ray Fluorescence Spectrometry
Second Edition
R. JENKINS, International Center for Diffraction Data, PA, USA
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This new book by a well-known author, provides a thoroughly up-to-date review of the latest progress in X-Ray
fluorescence, covering history, design of spectrometers, applications and interpretation of spectra. It is written
at a level that can be easily understood by both a newcomer to the technique as well as the experienced
practitioner.
- Provides a thoroughly up-to-date review of the progress that has occurred in the field over the last ten years
- In addition to the updating of each original chapter, new chapters have been added on the history of XRF, the design of X-ray spectrometers, applications of XRF and X-ray spectra.
- The author is an internationally known expert – he has written several books, journal articles and the section on X-Ray spectrometry in the acclaimed
Kirk-Othmer Encyclopedia of Industrial Chemistry, 4E
- Provides extensive bibliographies
This is a key resource for Analytical Chemists, Geologists, Metallurgists and Material Scientists practicing this
technique
0-471-29942-1 hbk 228pp due August 1999
Order Now!
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