About the Author
Professor Way Kuo, a pioneer in reliability of electronics systems, is renowned for his work in systems reliability. He is a member of US National Academy of Engineering and Academia Sinica, Taiwan, as well as a foreign member of the Chinese Academy of Engineering. He serves as President of City University of Hong Kong and is Editor-in-Chief of IEEE Transactions on Reliability. He has served at Texas A&M University and was on the senior management team of Oak Ridge National Laboratory when he served as Dean of Engineering at the University of Tennessee.