DescriptionInternational trade in high value perishables has grown enormously in the past few decades. In the developed world consumers now expect to be able to eat perishable produce from all parts of the world, and in most cases throughout the year. Perishable plant products are, however, susceptible to physical damage and often have a potential storage life of only a few days.
Given their key importance in the world economy, Crop Post-Harvest Science and Technology: Perishables devotes itself to perishable produce, providing current and comprehensive knowledge on all the key factors affecting post-harvest quality of fruits and vegetables. This volume focuses explicitly on the effects and causes of deterioration, as well as the many techniques and practices implemented to maintain quality though correct handling and storage. As highlighted throughout, regular losses caused by post-harvest spoilage of perishable products can be as much as 50%. A complete understanding, as provided by this excellent volume, is therefore vital in helping to reduce these losses by a significant percentage.
Compiled by members of the world-renowned Natural Resources Institute at the United Kingdom's University of Greenwich, with contributions from experts around the world, this volume is an essential reference for all those working in the area. Researchers and upper-level students in food science, food technology, post-harvest science and technology, crop protection, applied biology and plant and agricultural sciences will benefit from this landmark publication. Libraries in all research establishments and universities where these subjects are studied and taught should ensure that they have several copies for their shelves.
Root and tuber crops.
“Nonetheless and taken overall, this book will be a useful resource for professionals and students with a fundamental and practical interest in the challenge to maintain the post-harvest quality of perishable horticultural products.” (Experimental Agriculture, 4 October 2012)
* Internationally respected editorial board and contributing authors
* Fully comprehensive and up-to-date
* Must-have reference for all those working in the area