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Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Materials Characterization: Introduction to Microscopic and Spectroscopic Methods

Yang Leng

ISBN: 978-0-470-82300-2

Jan 2010

384 pages

Select type: O-Book

Description

This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
Part One: Microstructure Examinations.

Light microscopy.

X-ray diffraction methods.

Transmission electron microscopy.

Scanning electron microscopy.

Scanning probe microscopy.

Part Two: Chemical and Thermal Analysis.

X-Ray Spectroscopy for Elemental Analysis.

Electron Spectroscopy for Surface Analysis.

Secondary Ion Mass Spectrometry for Surface Analysis.

Vibrational Spectroscopy for Molecular Analysis.

Thermal analysis.