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Quantum Metrology: Foundation of the New SI

Quantum Metrology: Foundation of the New SI

Ernst O. Goebel, Uwe Siegner

ISBN: 978-3-527-34459-8

Nov 2019

275 pages

Select type: Hardcover

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Description

The book gives an overview of the applications of quantum physics to metrology, the science and technology of measurements. A special focus is on the use of quantum standards that have been used for the realization of the new definitions of the base units within the international system of units (SI). Thereby the book is an indispensable resource for every researcher and practitioner involved with high-precision measurements.
Foreword
Preface
List of Abbreviations
INTRODUCTION
BASICS
Measurement
The SI (Systeme International d'Unites)
LASER COOLING, ATOMIC CLOCKS, AND THE SECOND
Techniques for Laser Cooling
The Cs-Fountain Clock
Optical Clocks
SUPERCONDUCTIVITY, JOSEPHSON EFFECT, AND FLUX QUANTA
Josephson Effect and Quantum Voltage Standards
Flux Quanta and Superconducting Quantum Interference Devices
QUANTUM HALL EFFECT
Basic Physics of Three- and Two Dimensional Semiconductors
Two-Dimensional Electron Systems in Real Semiconductors
The Hall Effect
Quantum Hall Resistance Standards
SINGLE-CHARGE TRANSFER DEVICES AND THE NEW AMPERE
Basic Physics of Single-Electron Transport
Quantized Current Sources
Consistency Tests: Quantum Metrology Triangle
PLANCK CONSTANT, THE NEW KILOGRAM, AND THE MOLE
The Avogadro Experiment
The Watt Balance Experiment
The Mole, Unit of Amount of Susbstance
BOLTZMANN CONSTANT AND THE NEW KELVIN
Primary Thermometers
Realization and Disseminiation of the New Kelvin
SINGLE-PHOTON METROLOGY AND QUANTUM RADIOMETRY
Single-Photon Sources
Single-Photon Detectors
Metrological Challenges