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X-Ray Fluorescence Spectroscopy for Laboratory Applications

X-Ray Fluorescence Spectroscopy for Laboratory Applications

Michael Haschke, Jörg Flock, Michael Haller

ISBN: 978-3-527-34463-5

Feb 2022

450 pages

$160.00

Product not available for purchase

Description

The book starts out with a short overview of the physical fundamentals of the generation of x-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results.
Introduction
Basics of X-Ray Spectrometry
Sample Preparation
Instrument Types for XRF
Acqusition and Evaluation of X-Ray Spectra
Analytical Errors
Other Element Analytical Methods
Radiation Protection
Analysis of Homogeneous Materials
Analysis of Powders
Analysis of Liquids
Trace Analysis with Total Reflection X-Ray Spectrometry
Non-Homogeneous Samples
Analysis of Layer Systems
Analysis of Small Sample Areas
Determination of Element Distributions
Special Applications of XRF
Process Control and Automation
Quality Management and Method Validation