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X-Ray Fluorescence Spectroscopy for Laboratory Applications

X-Ray Fluorescence Spectroscopy for Laboratory Applications

Michael Haschke, Jörg Flock, Michael Haller

ISBN: 978-3-527-34463-5

Aug 2019

450 pages

$160.00

Product not available for purchase

Description

The book starts out with a short overview of the physical fundamentals of the generation of x-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results.
Introduction
Basics of X-Ray spctrometry
Sample preparation
Instrument types for XRF
Acqusition and evaluation of X-Ray spectra
Analytical errors
Other element analytical methods
Radiation protection
Analysis of homogeneous materials
Analysis of powders
Analysis of liquids
Trace analysis with Total reflection X-ray spectrometry
Non-homogeneous samples
Analysis of layer systems
Analysis of small sample areas
Determination of element distributions
Special applications of XRF
Process control and automation
Quality management and method validation